Secure Hybrid Edge Cloud Computing Framework for SDVs

As chip complexity increases and geometries shrink, traditional testing methods fall short in capturing system-level interactions. SLT addresses this gap by validating the behavior of the full system under near-production conditions, including board-level integration, thermal response, and real-use reliability. It is especially relevant for AI, server compute, automotive, and high-performance computing domains. System-Level Testing (SLT) is a critical phase in the semiconductor validation process that ensures integrated circuits (ICs) function correctly in real-world environments. Unlike traditional test methods that rely on synthetic test vectors and fault models, SLT evaluates chips by running actual software or firmware workloads in system-like conditions.